Full text loading...
(Color online) Ellipsometry measurements of the plasma oxidation for samples with Al grown on CoFe (a). Oxidation rate of the samples with Al layers on (b). The curves are polynomial fits used to determine the start of the CoFe oxidation , with an index number indicating the Al thickness in Å.
Onset of the CoFe oxidation as a function of the deposited Al thickness. The dashed lines indicate the times at which XPS measurements are performed.
(Color online) Co XPS spectra for samples with deposited Al after (a) and (b) oxidation. As a reference also the spectrum of an unoxidized sample is plotted. The arrow indicates the position of the shake-up peak.
(Color online) CoO thickness after oxidation, determined from the ellipsometry measurements, vs the amount of CoO that was determined from the XPS data of oxidation. The inset shows how the amount of CoO, is determined from the ellipsometry measurements of the Al sample.
Article metrics loading...