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(a) SEM image showing the morphology of the as-synthesized nanowires and (b) the corresponding EDX result, (c) low and (d) high magnification TEM images showing the morphology of the as-synthesized nanowires. The inset shows a highly diffuse electron diffraction ring pattern, indicating amorphous structure of the as-synthesized nanowires.
(Color online) (a) SEM image showing a three-point bending nanowire sample bridging a wide trench, and both ends of the wire were clamped to the substrate by EBID of carbonaceous materials, (b) EDX result from Frames A and B showing the almost absence carbon peak before EBID, and (c) EDX result from Frames A and B showing an obvious carbon peak after EBID, which indicates a layer of carbonaceous material was deposited within the Frame A and B after 2 min EBID. (d) AFM image of a suspended nanowire and its corresponding height profile along (e) and across (f) the wire for the nanowire length and diameter determination.
(Color online) (a) Cantilever and (b) nanowire deflections obtained by directly indenting a nanowire sitting on a solid Si substrate. (c) Cantilever and (d) nanowire deflections obtained on a suspended nanowire. (e) and (f) 3D AFM images showing the suspended nanowire morphology before and after three-point bending testing corresponding to (c) and (d), respectively. The nanowire fractured in a brittle manner at a bending force of . Note: Area “A” was dirt.
(Color online) Bending elastic modulus of the amorphous nanowire vs nanowire diameters.
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