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Electrical noise in gold nanocluster sensors
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10.1063/1.2168678
/content/aip/journal/apl/88/5/10.1063/1.2168678
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/5/10.1063/1.2168678
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of a MIME sensor showing (a) the gold nanoclusters with adsorbed vapor, (b) the nanocluster film situated between electrodes, and (c) the interdigitated electrodes that form the completed device.

Image of FIG. 2.
FIG. 2.

Current noise spectral density as a function of frequency with voltage as a parameter for a sensor having an gap. The compression at low voltages and the noise floor at higher frequencies are due to the measuring system noise.

Image of FIG. 3.
FIG. 3.

Current noise spectral density as a function of the applied voltage for the sensor of Fig. 2.

Image of FIG. 4.
FIG. 4.

The noise prefactor as function of device area including data from the present work and data from Ref. 4.

Image of FIG. 5.
FIG. 5.

The estimated detection limit, in parts per billion by volume (ppbv), as a function of the ac voltage amplitude for three operating frequencies. The sensor has an gap, and clusters with 2 nm cores and octanethiol shells.

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/content/aip/journal/apl/88/5/10.1063/1.2168678
2006-02-02
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical noise in gold nanocluster sensors
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/5/10.1063/1.2168678
10.1063/1.2168678
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