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TEM image recorded in the cross section with the electron beam along the and zone axes [(a) and (b), respectively]. Multibeam conditions enable all the dislocations to be observed. Note: the interface and the subinterface are indicated.
A montage of two weak beam dark field image taken with showing the subinterface corresponding to when the V/III ratio and both fluxes were increased. Large kinks (indicated by ) or dipole half loops (indicated by ) are formed at this subinterface.
Reorientation of a screw type TD: (a) A macrostep (macrostep I) approaches a screw dislocation; (b) The macrostep reaches the core of the screw dislocation after further growth; (c) The screw dislocation begins to redirect forming an edge segment due to the image force experienced as the macrostep overgrows the screw dislocation; (d) The redirected dislocation meets another macrostep (macrostep II) forcing the dislocation to reorient back into screw orientation as shown in (e); (f) A dipole half loop can also form due to the annihilation of two redirected screw dislocation segments with opposite sign.
Reorientation of an edge type TD (indicated as ED in the figure).
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