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XRD pattern and DSC trace recorded upon constant-rate heating at for the as-cast BMG.
Engineering stress-strains curve of the as-cast BMG with a SEM micrograph obtained from the surface of the sample as inset. The arrows in the micrograph indicate branching of shear bands.
TEM bright- and dark-field images [(a)–(d)] with selected area diffraction patterns from two different areas of the sample as inset. Figures 3(a) and 3(c) were taken in the same areas as Figs. 3(b) and 3(d), respectively.
HRTEM image obtained from the region with nano-scale crystals as shown in Figs. 3(a) and 3(c). The inset displays an enlarged HRTEM image revealing the detailed structure of the nano-scale crystals.
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