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Electrical charge trapping at defects on the surface
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10.1063/1.2172229
/content/aip/journal/apl/88/6/10.1063/1.2172229
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172229
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) AFM and (b) the corresponding KPFM images taken on an area of the surface with a step density of . (c) Example line profiles along the arrows in (a) and (b).

Image of FIG. 2.
FIG. 2.

(a) AFM and (b) the corresponding KPFM images taken on a large terrace of several micrometers on the surface. (c) Example line profiles along the arrows in (a) and (b).

Image of FIG. 3.
FIG. 3.

An unoccupied state STM image taken on a large terrace of several micrometers on the surface. The image was taken in constant-current mode with a tip bias voltage of and tunneling current of .

Image of FIG. 4.
FIG. 4.

(a) Unoccupied state and (b) occupied state STM images taken on a large terrace of several micrometers on the surface. Both images were taken in constant-current mode and taken simultaneously in one frame scan with forward line scans under a negative tip bias of and backward line scans under a positive tip bias of . Three domains A, B, C, and domain boundaries between them are labeled.

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/content/aip/journal/apl/88/6/10.1063/1.2172229
2006-02-07
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical charge trapping at defects on the Si(111)7×7 surface
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172229
10.1063/1.2172229
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