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XRD scan curve of 300 nm thick BNTO film on Si substrate. The inset shows RHEED pattern of BNTO film.
curve of the junction at the room temperature. The top inset shows the schematic circuit of the sample measurement and the bottom one is the resistance vs temperature curve of BNTO thin film.
Ferroelectric hysteresis loop of the junction.
Variation of the transient photovoltage in the junction with time when irradiated from the BNTO side and the Si side (the inset) by 1064 nm laser pulses, respectively.
Absorption spectra of the Si substrate (broken lines) and the BNTO film on the Si substrate (solid lines). The inset shows the band structure of the junction under the 1064 nm laser irradiation.
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