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Multifunctional characteristics of junctions
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10.1063/1.2172290
/content/aip/journal/apl/88/6/10.1063/1.2172290
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172290
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD scan curve of 300 nm thick BNTO film on Si substrate. The inset shows RHEED pattern of BNTO film.

Image of FIG. 2.
FIG. 2.

curve of the junction at the room temperature. The top inset shows the schematic circuit of the sample measurement and the bottom one is the resistance vs temperature curve of BNTO thin film.

Image of FIG. 3.
FIG. 3.

Ferroelectric hysteresis loop of the junction.

Image of FIG. 4.
FIG. 4.

Variation of the transient photovoltage in the junction with time when irradiated from the BNTO side and the Si side (the inset) by 1064 nm laser pulses, respectively.

Image of FIG. 5.
FIG. 5.

Absorption spectra of the Si substrate (broken lines) and the BNTO film on the Si substrate (solid lines). The inset shows the band structure of the junction under the 1064 nm laser irradiation.

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/content/aip/journal/apl/88/6/10.1063/1.2172290
2006-02-10
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multifunctional characteristics of BaNb0.3Ti0.7O3∕Sip-n junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172290
10.1063/1.2172290
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