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Contrast in scanning probe microscopy images of ultrathin insulator films
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10.1063/1.2172397
/content/aip/journal/apl/88/6/10.1063/1.2172397
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172397

Figures

Image of FIG. 1.
FIG. 1.

(Color online) SPM micrographs obtained with different SPM techniques showing the same region on the sample: (a) dynamic SFM with , (b) dissipation signal acquired simultaneously with (a), (c) dynamic cantilever STM with and , and (d) static cantilever STM with and . All micrographs show areas of with denoting islands nucleated on terraces, islands at step edges, and CaF covered terraces. The topography images (a), (c), and (d) use the same gray scale. Line scans from (c) and (d) along the marked line are shown in (e) together with a model of the film’s cross section.

Image of FIG. 2.
FIG. 2.

(Color online) Dependence of the frequency shift as measured by scanning force spectroscopy on the bias voltage applied between tip and sample for the CaF bilayer and a island on top of the CaF bilayer. The lines show least-square fits of the data.

Tables

Generic image for table
Table I.

Dependence of the apparent heights of first layer islands in constant current STM images on the bias voltage .

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/content/aip/journal/apl/88/6/10.1063/1.2172397
2006-02-08
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Contrast in scanning probe microscopy images of ultrathin insulator films
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/6/10.1063/1.2172397
10.1063/1.2172397
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