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Lattice vibrations in hexagonal epitaxial films on -plane sapphire substrates by infrared reflectance spectra
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Image of FIG. 1.
FIG. 1.

Experimental infrared reflectance spectra (dotted lines) of the films on sapphire and their best fit results (solid lines). Each spectrum is successively shifted by 1.0 in the vertical direction. Every 10th point in the range and , every other point in the range , and every 40th point in the range in the experimental data are shown for clarity. The horizontal coordinate is the logarithmic unit to enlarge the reststrahlen region.

Image of FIG. 2.
FIG. 2.

Mn composition dependence of (a) the phonon frequency, (b) the phonon frequency, and (c) the broadening value of the phonon for the films. The solid lines in (a) and (b) represent the linear fitting results. The dashed line in (c) is only used to guide the eye.

Image of FIG. 3.
FIG. 3.

The infrared dielectric functions of the films with different Mn compositions. and are the real and imaginary parts of the dielectric functions, respectively. The inset is an enlargement of the phonon mode region.

Image of FIG. 4.
FIG. 4.

The infrared absorption coefficients of the films with Mn composition 0.0% (solid line), 0.8% (dashed-dotted line), and 1.5% (dotted line) from the dielectric functions.


Generic image for table
Table I.

The parameter values of the Lorentz oscillator models were derived from the simulations to the infrared reflectance spectra of the films. The 90% confidence limits of the fitting parameters were given in brackets.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Lattice vibrations in hexagonal Ga1−xMnxN epitaxial films on c-plane sapphire substrates by infrared reflectance spectra