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(a) A typical x-ray powder diffraction pattern and (b) IR spectrum of the products.
(a) Low-magnification and (b) high-magnification FESEM images of the obtained 2H–SiC nanoflakes. (c) TEM image of the products.
(a) TEM image and selective area ED pattern (inset) of an individual nanoflake; and (b) the corresponding HRTEM image.
(a) Raman spectrum and (b) Room-temperature PL spectrum of the 2H–SiC nanoflakes.
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