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Influence of current noise on the relaxation oscillation dynamics of semiconductor lasers
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10.1063/1.2176852
/content/aip/journal/apl/88/7/10.1063/1.2176852
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/7/10.1063/1.2176852
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Measured RIN spectra of the VCSEL under test at a constant current of and at different carrier noise strengths together with corresponding fits.

Image of FIG. 2.
FIG. 2.

The RO damping rate (full, ) and (dashed, ) vs the noise strength at a bias current of . (a) Measurements. (b) Numerical, computed by integrating Eqs. (2) and (3). (, , , , , , , , , , , , .) The full lines guide the eye and is the RO frequency in the absence of noise.

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/content/aip/journal/apl/88/7/10.1063/1.2176852
2006-02-14
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Influence of current noise on the relaxation oscillation dynamics of semiconductor lasers
http://aip.metastore.ingenta.com/content/aip/journal/apl/88/7/10.1063/1.2176852
10.1063/1.2176852
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