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Typical cross-sectional SEM image of a monolayer colloidal crystal-polymer nanocomposite made by spincoating.
Wafer-scale ncp monolayer colloidal crystal made by spincoating. (a) Photograph of a 4-in. sample illuminated with white light. (b) Typical top-view SEM image of the sample in (a). Inset showing FFT of a region. (c) Higher magnification SEM image. (d) PCF calculated from the image in (b). For comparison, the PCF for an ideal hexagonal lattice with center-to-center distance is also shown (black lines).
Normal incidence reflectivity spectrum (black curve) of the sample shown in Fig. 2(a). The red curve is calculated using SWA.
Patterning ncp monolayer colloidal crystal by standard microfabrication. (a) Photograph of a micropatterned sample. (b) Top-view SEM image of an wide line in (a).
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