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Minute doping with deleterious rare earths in films for flux pinning enhancements
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View: Figures


Image of FIG. 1.
FIG. 1.

(Color online) Pinning force plots for the minutely doped films ( and 0.001). YBCO is the solid black line. An Tb doped YBCO is included for comparison which performed the best of the level doping (10% of Y). The pinning force was calculated by : (A) at and (B) at .

Image of FIG. 2.
FIG. 2.

(Color online) is plotted as a function of magnetic field for the films (, 0.01, 0.001, and 0.0001). The 10%, 1%, and 0.1% doping of Y are representative data. The 0.01% doping is a single deposition. The data are for magnetic .

Image of FIG. 3.
FIG. 3.

(Color online) Examples of SIMS data for the minutely doped films showing the presence of the minor dopants in the films: (A) Overall data for , ; (B) close-up for , ; and (C) close-up for , . The Cu concentration in the figure appears to be constant beyond the interface. It should be noted that it is an artifact due to the mass interference between and in the STO substrate. Note that the kink in the signal near the interface is an artifact, since the sputtering yield and ionization probability change at the interface.

Image of FIG. 4.
FIG. 4.

(Color online) SEM of the surface for an film showing the formation of nanoprecipitates. The nanoparticulates were seen in several of the films examined, indicating that as opposed to Y-site substitution, nanoparticles are formed.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Minute doping with deleterious rare earths in YBa2Cu3O7−δ films for flux pinning enhancements