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Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes
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10.1063/1.2345225
/content/aip/journal/apl/89/10/10.1063/1.2345225
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/10/10.1063/1.2345225
/content/aip/journal/apl/89/10/10.1063/1.2345225
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/content/aip/journal/apl/89/10/10.1063/1.2345225
2006-09-06
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/10/10.1063/1.2345225
10.1063/1.2345225
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