1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Mechanism and scalability in resistive switching of metal- interface
Rent:
Rent this article for
USD
10.1063/1.2349312
/content/aip/journal/apl/89/12/10.1063/1.2349312
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/12/10.1063/1.2349312
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(triangle symbols) and (square symbols) of a Au-PCMO setup at on (solid) and off (open) states. Bottom left inset: the switching series. Bottom right inset: three-lead setup.

Image of FIG. 2.
FIG. 2.

between 150 and . Top (bottom) gray symbols: data at off (on) states. Lines: VRH fits. Inset: the calculated defect distribution in the interface layer. Open triangles: the on state. Solid circles: the off state.

Image of FIG. 3.
FIG. 3.

Hopping range with respect to frequency for both off (open triangles) and on (solid circles) states. The switch is determined by low frequency intercluster hopping, whereas at high frequencies, percolative intracluster hopping occurs. Inset: raw data at several temperatures show the scaling of Mott’s formula, where .

Loading

Article metrics loading...

/content/aip/journal/apl/89/12/10.1063/1.2349312
2006-09-20
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mechanism and scalability in resistive switching of metal-Pr0.7Ca0.3MnO3 interface
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/12/10.1063/1.2349312
10.1063/1.2349312
SEARCH_EXPAND_ITEM