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Atomic force microscope two-dimensional topographic view of the period patterned MEH-PPV grating.
cw-PL spectra from the active imprinted grating at (dotted line), 40° (dashed line), and 45° (continuous line). The arrows indicate the peak shift upon increasing the detection angle. Inset: wavelength dependence of .
DFB emission spectra collected under pulsed excitation (from bottom to top, the pump fluences are 22, 31, 44, and ). Inset: DFB peak emission intensity vs absorbed excitation fluence. The solid line is a linear fit to the experimental data.
Polarized PL spectra, parallel (continuous line) and perpendicular (dashed line) to the waveguide plane (excitation energy of ). Inset: spectral dependence of the polarization contrast in the gain region.
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