1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Real-time detection of probe loss in atomic force microscopy
Rent:
Rent this article for
USD
10.1063/1.2357876
/content/aip/journal/apl/89/13/10.1063/1.2357876
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/13/10.1063/1.2357876
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Shows the experimentally obtained amplitude signal during ESM-AFM imaging. (a) and (b) shows the amplitude profile and reliability index when imaging rectangular and triangular samples, respectively.

Image of FIG. 2.
FIG. 2.

(Color online) Shows the experimental vertical piezoactuation signals during TM-AFM imaging. (a) and (b) shows the height profile based on vertical actuation signal when imaging rectangular and triangular samples, respectively.

Image of FIG. 3.
FIG. 3.

Model of the cantilever near its resonant frequency is mimicked by a high speed electrical circuit implemented on Xilinx Virtex II Pro XC2VP30 FPGA. Nonzero value of arises from initial condition mismatch, , and .

Image of FIG. 4.
FIG. 4.

(Color online) In (a) and (b), a rectangular profile is imaged at 20 and , respectively.

Loading

Article metrics loading...

/content/aip/journal/apl/89/13/10.1063/1.2357876
2006-09-28
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real-time detection of probe loss in atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/13/10.1063/1.2357876
10.1063/1.2357876
SEARCH_EXPAND_ITEM