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Quantitative analysis of hysteresis in carbon nanotube field-effect devices
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10.1063/1.2358290
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    Affiliations:
    1 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    2 Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    3 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 and Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    4 Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    5 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    6 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 and Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    a) Author to whom correspondence should be addressed; electronic mail: kars@rpi.edu
    Appl. Phys. Lett. 89, 132118 (2006); http://dx.doi.org/10.1063/1.2358290
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/content/aip/journal/apl/89/13/10.1063/1.2358290
2006-09-29
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quantitative analysis of hysteresis in carbon nanotube field-effect devices
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/13/10.1063/1.2358290
10.1063/1.2358290
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