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Tip-enhanced fluorescence microscopy of high-density samples
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10.1063/1.2358122
/content/aip/journal/apl/89/14/10.1063/1.2358122
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/14/10.1063/1.2358122
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Simplified schematic diagram of the experiment. APD: avalanche photodiode; DDS: direct digital synthesizer; DM: dichroic mirror; SF: spectral filter; LA: lock-in amplifier; OBJ: objective; PC: personal computer; P: polarizer; PZT: piezoelectric transducer; OF: optical fiber.

Image of FIG. 2.
FIG. 2.

(Color online) High-resolution images of quantum dots. (a) AFM image (topography); (b) photon-sum image; (c) TEFM image. (a)–(c) are for a field of view. (d) TEFM image of a single quantum dot; (e) signal profile specified by the dotted line in (d).

Image of FIG. 3.
FIG. 3.

Optimization of oscillation amplitude. (a) BudgetSensors Multi75 probes; (b) Nanosensors ATEC-FM-10 probes. Open circles: TEFM data; solid squares: photon-sum data. A total of 9 QDs was measured in (a) and 12 in (b) using two to three different tips for each data set. Each data point is the mean of all QDs measured and error bars are the standard error. The uncertainty in the oscillation amplitude is .

Image of FIG. 4.
FIG. 4.

Image contrast at high density. Open circles: TEFM data; solid squares: photon-sum data. Each data point is the mean of at least ten different quantum dots and error bars are the standard error.

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/content/aip/journal/apl/89/14/10.1063/1.2358122
2006-10-06
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Tip-enhanced fluorescence microscopy of high-density samples
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/14/10.1063/1.2358122
10.1063/1.2358122
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