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(a) Top view SEM image of AlN nanotips showing the hexagonal plate stacking, (b) HRTEM image of the surface of the nanotip depicting the stepped edge morphology, (c) schematic of the step-edge model, and (d) distribution of step spacing (top) and step heights (bottom) in units of and , respectively.
[(a)–(f)] TEM of InN nanotips showing different apex angles. Inset in (e) shows the electron diffraction of the marked area in (e); same scale bar for (c)–(f) shown in (f); (g) XRD pattern of the nanotips with the dotted lines marking the bulk InN position for reference; (h) HRTEM image of the narrow apex angle InN nanotip, with inset showing the diffraction pattern.
(Color online) (a) Histogram of occurrence (%) of InN nanotips with different apex angles; (b) averaged distribution centred at observed peaks in apex angles shown in (a).
Calculated (Calc.), and experimental (Expt.) values of apex angles (in degrees), corresponding to a fixed ratio for solid AlN, GaN, and InN nanotips. Available references (Ref.) are also listed alongside. The data for InN come from the present work.
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