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(Color online) (a) AC-AFM image of an unprocessed individual MWNT with . (b) SEM image of a large flake of raw MWNTs placed between the arms of the thermal probe. (c) SEM image of an individual MWNT protruding from the flake. (d) Diagram of the circuit used in the experiment.
(a) Conductance measurements made during the initial approach of the flake, followed by a stable mechanical contact between the MWNT and the HOPG. Inset shows the “annealing” of the MWNT/HOPG contact during the initial voltage sweep. (b) Statistical analysis of all 77 contacts made after annealing at . The histogram shows that of the contacts were in the range . (c) Histogram for conductance values between 0 and only.
(a) and (b) corresponding curve for an individual MWNT. (c) and (d) corresponding curve for a MWNT bundle.
Electrical breakdown of individual MWNTs showing (a) gradual decline in current followed by discrete steps, (b) both increasing and decreasing current steps, and (c) another example of steps during breakdown. The numbers adjacent to the arrows indicate the magnitudes of the steps in .
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