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(a) Scanning electron microscopy image showing the morphology of the SiC nanorods. (b) TEM image of an individual nanorod. The inset is the corresponding electron diffraction pattern, showing that the nanorod grows along  direction.
Room-temperature steady-state PL spectrum of the SiC nanorods.
(a) Raman spectrum of the nanorods. The red line is the experimental result and the blue line is the curve fit by addition of the pink lines. (b) XRD pattern showing that the nanorods are pure containing stacking faults. (c) HRTEM image showing the stacking faults in the nanorods. The inset is the enlargement of the selected area revealing the threefold stacking fault nature. (d) Schematic model of perfect and containing a threefold stacking fault; the region around the stacking fault (between two dash lines) shows the structure resembling that of .
Room-temperature time evolution of the luminescence intensity of the emission at .
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