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High resolution determination of ferromagnetic metallic limit in epitaxial films on
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Image of FIG. 1.
FIG. 1.

High-resolution XRD scans of representative films in the series . The sharp substrate (004) peak overlaps with the corresponding film peak, and thickness fringes may be seen.

Image of FIG. 2.
FIG. 2.

magnetization vs field loops for thick films with , 0.41, and 0.42. The magnetometer axis was parallel to the orthorhombic [100] film easy axis (Ref. 19). Inset: Corresponding loop for the target at .

Image of FIG. 3.
FIG. 3.

Resistivity vs temperature for films with , 0.41, and 0.42. Inset: Resistance vs for the target. The small suppression in the transition temperature may be due to deoxygenation.

Image of FIG. 4.
FIG. 4.

Thin film phase diagram for epitaxial on NGO in . Metal-insulator transition temperatures (▵) and ferromagnetic phase fractions (●) are plotted. The extrapolation of the boundary between the phase-separated metallic phase (PSM) and the paramagnetic-insulating (PMI) phase assumes that percolation requires a ferromagnetic fraction of 10%, which is a lower bound (Ref. 21). The inset shows the corresponding phase diagram for polycrystalline samples (data from Refs. 18 and 22) where the phase fraction of the ferromagnetic metallic phase (FMM) is for (Ref. 18). The open triangles (▵) correspond to metal-insulator transition temperatures.


Generic image for table
Table I.

Ferromagnetic volume fractions in the 20 and film series for , 0.41, and 0.42. Values calculated from dividing the saturation magnetization by the fully spin-aligned value .


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High resolution determination of ferromagnetic metallic limit in epitaxial La1−xCaxMnO3 films on NdGaO3