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(Color online) A photograph of a metal-mixed sample which consists of a layer of alloy on a -thick PEEK film that was subsequently implanted with a beam to a dose of . The sample is square with contacts evaporated in the corners and wires attached using solder. (b) Cross-sectional STEM image of a metal mixed sample, and (c) corresponding energy dispersive x-ray analysis (EDAX) profile showing the relative concentrations of Sn (solid line) and C (dashed line) in the near surface of the PEEK; (b) and (c) demonstrate that implantation has mixed the initial alloy layer over of the subsurface region of the PEEK film. The chemical structure of PEEK is inset to (c).
(Color online) Resistance (two-terminal minus temperature-dependent lead resistance) vs temperature for sample A ( on PEEK, ), sample B ( on PEEK, ) and sample C (bare PEEK, ). The addition of the thin layer prior to implantation leads to a metallic temperature dependence in contrast to sample C, which show an insulating temperature dependence. A sharp drop in resistance is apparent in samples A and B at low .
(Color online) Four-terminal resistance vs for sample A (left axis) and B (right axis) demonstrating the presence of a zero resistance state at low . The critical temperatures are 1.9 and for samples A and B, respectively, (inset) vs magnetic field , oriented perpendicular to the plane of the plastic film, at for sample A, demonstrating a field-induced transition to a normal state. The measured critical field is .
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