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Individual classification of buried transistors in live microprocessors by functional infrared emission spectral microscopy
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10.1063/1.2358935
/content/aip/journal/apl/89/15/10.1063/1.2358935
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2358935
/content/aip/journal/apl/89/15/10.1063/1.2358935
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/content/aip/journal/apl/89/15/10.1063/1.2358935
2006-10-10
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Individual classification of buried transistors in live microprocessors by functional infrared emission spectral microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2358935
10.1063/1.2358935
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