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Quadraxial probe for high resolution near-field scanning rf/microwave microscopy
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10.1063/1.2358945
/content/aip/journal/apl/89/15/10.1063/1.2358945
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2358945
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Near-field microwave/rf electric field measurement setup. The four conductors of quadraxial probe are numbered. (b) Photograph of quadraxial probe.

Image of FIG. 2.
FIG. 2.

Normalized isoline magnitude of total electric field (at ) calculated using numerical method (FEM) in half cross-section view for (a) the coaxial probe and (b) the quadraxial probe.

Image of FIG. 3.
FIG. 3.

Comparing the electric field magnitude falloff measurements. For coaxial probe, we measured (single-ended transmission coefficient) from the VNA. For the triaxial probe, we measured (single-ended differential mode transmission coefficient) from the VNA. For the quadraxial probe, we measured from the VNA. We calculated (normal electric field component) of coaxial and quadraxial probes from FEM simulations. All measurements and simulations were at .

Image of FIG. 4.
FIG. 4.

(a) Scanning microwave/rf transmission microscopy measurement setup. (b) Magnitude of transmissions and vs position while scanning across the wide strip line for the quadraxial probe and the coaxial probe, respectively. (c) Phase measurement. All measurements were made at . The metal stripe on glass sample is sketched at the top of this figure, where the width of the strip has the same scale as the axis of the plot.

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/content/aip/journal/apl/89/15/10.1063/1.2358945
2006-10-10
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quadraxial probe for high resolution near-field scanning rf/microwave microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2358945
10.1063/1.2358945
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