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Hysteresis loops of the continuous films and the nanostructures (dots and trenches) with composition of . The inset shows a scanning electron microscopy image of the nanostructures.
Evolutions of the exchange bias field with the IrMn thickness for stacks.
Dependence of the exchange bias field on the annealing temperature for stacks.
Evolutions of the exchange bias field with the number of repeats for stacks.
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