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Out-of-plane exchange bias in bilayers sputtered on prepatterned nanostructures
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10.1063/1.2359429
/content/aip/journal/apl/89/15/10.1063/1.2359429
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2359429
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Hysteresis loops of the continuous films and the nanostructures (dots and trenches) with composition of . The inset shows a scanning electron microscopy image of the nanostructures.

Image of FIG. 2.
FIG. 2.

Evolutions of the exchange bias field with the IrMn thickness for stacks.

Image of FIG. 3.
FIG. 3.

Dependence of the exchange bias field on the annealing temperature for stacks.

Image of FIG. 4.
FIG. 4.

Evolutions of the exchange bias field with the number of repeats for stacks.

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/content/aip/journal/apl/89/15/10.1063/1.2359429
2006-10-09
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Out-of-plane exchange bias in [Pt∕Co]–IrMn bilayers sputtered on prepatterned nanostructures
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2359429
10.1063/1.2359429
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