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SEM images showing the surface morphology of the from samples (a) S–Ga and (b) S–N upon etching in .
TEM bright-field cross-sectional images under a (0002) two-beam condition of the samples (a) S–Ga and (b) S–N, with the HRTEM images after inverse Fast Fourier transform processing shown in the insets.
Temperature-dependent PL spectra from of samples (a) S–Ga and (b) S–N, with the emission energy vs temperature of both emissions summarized in the insets.
Arrhenius plots of the integrated PL intensities for the peaks (a) , (b) , (c) , and (d) over the temperature range from , where the solid lines represent the fitted results by the least-squares calculations.
TRPL decay spectra measured at different energies for samples (a) S–Ga and (b) S–N at .
Fitting values from temperature-dependent PL integrated intensities for emissions of samples S–Ga and S–N.
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