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Band offset measurements of heterostructure system
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10.1063/1.2360924
/content/aip/journal/apl/89/15/10.1063/1.2360924
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2360924
/content/aip/journal/apl/89/15/10.1063/1.2360924
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/content/aip/journal/apl/89/15/10.1063/1.2360924
2006-10-11
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Band offset measurements of ZnO∕6H-SiC heterostructure system
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2360924
10.1063/1.2360924
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