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High resolution XRD data on the -plane InN film on -plane sapphire substrate showing the respective symmetric reflections. The inset shows a reciprocal space map in space.
(a) Schematic of a wurtzite unit cell showing the relevant planes and the choice of coordinates. The polarizer is rotated about the and axes to change the polarization angle for the -plane and the -plane films, respectively. Variation of the wavelength integrated PL signal with for (b) the -plane and (c) the -plane InN film, measured at .
(a) PL spectra and of the -plane film for and , respectively. (b) Polarization anisotropy percentage, defined as , of the above PL spectrum. (c) Measured absorption coefficient squared of the -plane film as a function of energy for the two polarizations (circles). The lines represent the equation . The inset shows the full transmission spectrum.
Relative oscillator strengths of the three band edge transitions , , and in InN, for polarization along , , and , as a function of strain (, ) in the plane. The second plot shows the two curves (dashed line) and (bold line). The circles mark their intersection coordinate (, ).
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