1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Tunability and permittivity-temperature characteristics of highly (100) oriented compositionally graded thin films grown by pulse-laser deposition
Rent:
Rent this article for
USD
10.1063/1.2361262
/content/aip/journal/apl/89/15/10.1063/1.2361262
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2361262
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) XRD patterns of the up- and downgraded BSSnT thin films. The inset is the XRD patterns of four BSSnT ceramic targets with , 0.2, 0.3, and 0.4, respectively.

Image of FIG. 2.
FIG. 2.

(Color online) SEM image of the cross section of the downgraded BSSnT thin film.

Image of FIG. 3.
FIG. 3.

(Color online) Permittivity as a function of direct current (dc) bias at for BSSnT thin films: (a) upgraded and (b) downgraded.

Image of FIG. 4.
FIG. 4.

(Color online) Permittivity as a function of temperature at 1, 10, and for BSSnT thin films. (a) Upgraded and (b) downgraded.

Image of FIG. 5.
FIG. 5.

(Color online) Permittivity as a function of temperature at for upgraded BSSnT thin films. A, B, C, and D represent the assumed Gaussian curves for each layer. E is the summation of them. F is the measured curve. The inset shows the permittivity vs temperature characteristic of BSSnT ceramic targets with , 0.2, 0.3, and 0.4 at . The peak temperature of each ceramic target was used as the peak temperature value in the Gaussian distribution of permittivity of each layer.

Loading

Article metrics loading...

/content/aip/journal/apl/89/15/10.1063/1.2361262
2006-10-12
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Tunability and permittivity-temperature characteristics of highly (100) oriented compositionally graded (Ba0.7Sr0.3)(SnxTi1−x)O3 thin films grown by pulse-laser deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/15/10.1063/1.2361262
10.1063/1.2361262
SEARCH_EXPAND_ITEM