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(Color online) Symmetric XRD diffraction profile and phi scan (inset) of the BST and STO 101 reflections.
Ba and Sr photoelectron spectra, acquired using radiation, of as deposited epitaxial BST films at takeoff angles of 90°, 30°, and 10°. At each takeoff angle the spectra have been normalized to the maximum peak value for the given angle. Data are represented by open circles.
Ba and Sr XPS spectra after various aqueous and annealing treatments acquired using radiation at a takeoff angle of 10°. The weaker intensity of the and features for the oxygen annealed treated film (top data set), as compared to the as deposited sample, may be due partly to selective etching of the BST surface resulting in a decrease in terminated surface areal density as discussed in Ref. 17.
O and C photoemission spectra of the as deposited and treated surfaces acquired using radiation at a takeoff angle of 30°. Spectra of the as deposited sample are represented by the dashed lines (three equivalent spectra displaced vertically for comparison to the spectra for treated surfaces) while the solid lines represent photoemission spectra taken after a sample received the specified treatment.
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