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Comparison of interference-fringe amplitude variation during SPC of HW and PE films during a anneal. See text for explanation of points A, B, and C.
Left axis: Crystallization time as a function of bonded H in HW and PE films. Right axis: Total oxygen in as-deposited films. Crystallization temperature is .
(Color online) (a) Crystallization time and (b) void fraction as a function of deposition rate for HW films. SPC anneal temperature is .
Arrhenius plot of incubation and crystallization times for HW and PE films as a function of annealing temperature. Enthalpy , entropy , and free-energy barrier values are given in the table. is Boltzmann’s constant.
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