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(Color online) (a) XRD scan of a film ( thick) on a (001) substrate with ( thick) and Au as bottom and top electrodes, respectively. The inset shows a high resolution scan near the 002 peak measured with a monochromatic x-ray source . The left- and right-hand side peaks come from 002 and 002 reflections, respectively. [(b) and (c)] scans of 112 and 112 reflections, respectively. Note that the scale of intensity is logarithmic in all scans except the inset (to clearly distinguish between the film and the substrate peaks).
(a) -contrast STEM cross-section image of a film ( thick) on a (001) substrate. (b) A high resolution image of the interface region marked with the white rectangle in (a) showing the coherent, sharp interfaces.
(Color online) (a) Magnetization vs temperature curves of a film ( thick) on a substrate with a bottom layer. The red circles and blue triangles were measured at with field-cooled and zero-field-cooled configurations, respectively. The contributions from the layer and the substrate were subtracted from the original data. (b) Dielectric constant (the purple solid and red dashed lines) and dielectric loss tangent (the green dash-dotted and blue dash-dot-dotted lines) vs temperature curves of a film capacitor measured at . The solid and dash-dotted (the dashed and dash-dot-dotted) lines are measured with decreasing (increasing) temperature.
(Color online) (a) [(b) ] vs electric field loops of a film ( thick) capacitor measured at a temperature of and a frequency of . The red solid and blue dotted lines are measured with increasing and decreasing the electric fields, respectively.
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