1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Antiferroelectricity in multiferroic epitaxial films
Rent:
Rent this article for
USD
10.1063/1.2362585
/content/aip/journal/apl/89/16/10.1063/1.2362585
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/16/10.1063/1.2362585
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) XRD scan of a film ( thick) on a (001) substrate with ( thick) and Au as bottom and top electrodes, respectively. The inset shows a high resolution scan near the 002 peak measured with a monochromatic x-ray source . The left- and right-hand side peaks come from 002 and 002 reflections, respectively. [(b) and (c)] scans of 112 and 112 reflections, respectively. Note that the scale of intensity is logarithmic in all scans except the inset (to clearly distinguish between the film and the substrate peaks).

Image of FIG. 2.
FIG. 2.

(a) -contrast STEM cross-section image of a film ( thick) on a (001) substrate. (b) A high resolution image of the interface region marked with the white rectangle in (a) showing the coherent, sharp interfaces.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Magnetization vs temperature curves of a film ( thick) on a substrate with a bottom layer. The red circles and blue triangles were measured at with field-cooled and zero-field-cooled configurations, respectively. The contributions from the layer and the substrate were subtracted from the original data. (b) Dielectric constant (the purple solid and red dashed lines) and dielectric loss tangent (the green dash-dotted and blue dash-dot-dotted lines) vs temperature curves of a film capacitor measured at . The solid and dash-dotted (the dashed and dash-dot-dotted) lines are measured with decreasing (increasing) temperature.

Image of FIG. 4.
FIG. 4.

(Color online) (a) [(b) ] vs electric field loops of a film ( thick) capacitor measured at a temperature of and a frequency of . The red solid and blue dotted lines are measured with increasing and decreasing the electric fields, respectively.

Loading

Article metrics loading...

/content/aip/journal/apl/89/16/10.1063/1.2362585
2006-10-18
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Antiferroelectricity in multiferroic BiCrO3 epitaxial films
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/16/10.1063/1.2362585
10.1063/1.2362585
SEARCH_EXPAND_ITEM