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Charge-injection-induced dynamic screening and origin of hysteresis in field-modulated transport in single-wall carbon nanotubes
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10.1063/1.2362586
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    Affiliations:
    1 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    2 Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    3 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 and Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    4 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    5 Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180 and Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 8th Street, Troy, New York 12180
    a) Author to whom corespondence should be addressed; electronic mail: kars@rpi.edu
    Appl. Phys. Lett. 89, 162108 (2006); http://dx.doi.org/10.1063/1.2362586
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/content/aip/journal/apl/89/16/10.1063/1.2362586
2006-10-19
2014-11-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Charge-injection-induced dynamic screening and origin of hysteresis in field-modulated transport in single-wall carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/16/10.1063/1.2362586
10.1063/1.2362586
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