1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Thermal conductivity contrast measurement of fused silica exposed to low-energy femtosecond laser pulses
Rent:
Rent this article for
USD
10.1063/1.2363957
/content/aip/journal/apl/89/16/10.1063/1.2363957
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/16/10.1063/1.2363957
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Sample preparation and principle of a scanning thermal microscope used in CCM.

Image of FIG. 2.
FIG. 2.

(Color online) Topography of a portion of laser exposed specimen (left) and corresponding conductivity mapping (right). Spacing between laser tracks is on this specimen.

Image of FIG. 3.
FIG. 3.

(Color online) Topography (left) and corresponding conductivity mapping of a specimen scanned multiple times (right).

Image of FIG. 4.
FIG. 4.

Average probe current variation across an scan of the pattern shown in Fig. 3. Labels indicate track number so that it can easily be matched with Fig. 3.

Loading

Article metrics loading...

/content/aip/journal/apl/89/16/10.1063/1.2363957
2006-10-18
2014-04-17
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermal conductivity contrast measurement of fused silica exposed to low-energy femtosecond laser pulses
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/16/10.1063/1.2363957
10.1063/1.2363957
SEARCH_EXPAND_ITEM