Full text loading...
(Color online) Sample preparation and principle of a scanning thermal microscope used in CCM.
(Color online) Topography of a portion of laser exposed specimen (left) and corresponding conductivity mapping (right). Spacing between laser tracks is on this specimen.
(Color online) Topography (left) and corresponding conductivity mapping of a specimen scanned multiple times (right).
Average probe current variation across an scan of the pattern shown in Fig. 3. Labels indicate track number so that it can easily be matched with Fig. 3.
Article metrics loading...