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Multiple reference Fourier transform holography with soft x rays
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View: Figures


Image of FIG. 1.
FIG. 1.

(Color online) (a) Scanning electron micrograph (SEM) of the FTH mask. The thinned F shape within the recessed object hole is the sample. (b) SEM of the opposite side of the structure in (a) recorded with a electron potential reveals a faint image of the sample which is buried below of Au. Furthermore, the micrograph confirms that the reference holes penetrate the entire structure. (c) Cross section illustration of the FTH mask including film thicknesses.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Soft x-ray Fourier transform hologram of the mask in Fig. 1(a). The common logarithm of the intensity is plotted; the scale bar denotes the number of photons detected. The displayed correspond to a momentum transfer of . (b) Enlargement shows details of the interference pattern characteristics for the five reference sources. (c) Reconstructed holographic images of the sample intensity, i.e., the squared magnitude of the complex autocorrelation.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Coherent diffraction pattern resulting from weak illumination of the FTH mask. For clarity only the center part, up to , is shown; the full pattern used for the reconstruction extends to . The scale bar corresponds to the number of photons detected in each pixel and is shared with (b) which shows an enlarged section of (a) containing detected photons. (c) The sample is very faint in this single subimage where . (d) The sample is clearly recognizable in this composite image where . (e) Comparison of linecuts through (c) and (d) and a low-noise image similar to Fig. 2(c).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multiple reference Fourier transform holography with soft x rays