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Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity
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10.1063/1.2374865
/content/aip/journal/apl/89/18/10.1063/1.2374865
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/18/10.1063/1.2374865
/content/aip/journal/apl/89/18/10.1063/1.2374865
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/content/aip/journal/apl/89/18/10.1063/1.2374865
2006-11-02
2014-11-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/18/10.1063/1.2374865
10.1063/1.2374865
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