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X-ray diffractogram of 9.5% yttria-doped zirconia film with a thickness of recorded after conductivity measurements.
Temperature dependence of electrical conductivity of 9.5% yttria-doped zirconia nanofilms of different thicknesses deposited on MgO substrate and a film deposited on substrate. The inset shows the experimental schematic for electrical measurements.
Complex impedance spectra of thick doped zirconia film deposited on (001) MgO substrate at various temperatures.
Arrhenius plot of conductivity relaxation times obtained from electrical modulus spectrum for various yttria-doped zirconia samples. The inset shows a comparison of frequency dependence of imaginary part of electrical modulus and impedance for a film that was grown on MgO.
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