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Misfit strain relaxation in epitaxial thin films on orthorhombic substrates
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10.1063/1.2214216
/content/aip/journal/apl/89/2/10.1063/1.2214216
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2214216
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Variation of the residual strains and elastic strain energy density with film thickness.

Image of FIG. 2.
FIG. 2.

(Color online) Variation of the principal residual stresses with film thickness as calculated by the linear theory of elasticity.

Image of FIG. 3.
FIG. 3.

(Color online) Variation of linear misfit dislocation density with film thickness, including the critical film thicknesses for misfit dislocation formation.

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/content/aip/journal/apl/89/2/10.1063/1.2214216
2006-07-10
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Misfit strain relaxation in (Ba0.60Sr0.40)TiO3 epitaxial thin films on orthorhombic NdGaO3 substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2214216
10.1063/1.2214216
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