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Upper: XRD scan for a substrate/ heterostructure. The inset shows the off-axis scans for the (110) peaks of both layers. The values of the angle are 43.4° and 44.1° for and , respectively. Lower: high resolution cross-section STEM image of the interface (no natural barrier is observed). An edge dislocation core resulting from the lattice mismatch is highlighted. The inset shows a lower magnification image.
(a) Resistance vs field for junctions with (a) a barrier and (b) a natural barrier, exhibiting positive and negative TMRs, respectively. (c) Plot of the TMR and resistance-area product for junctions with varying barrier thickness. The lines are a guide to the eye. All the measurements are at with bias voltage.
Resistance vs temperature for a junction with a barrier (closed) and a natural barrier (open).
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