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Improved oxygen diffusion model to explain the effect of low-temperature baking on high field losses in niobium superconducting cavities
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10.1063/1.2220059
/content/aip/journal/apl/89/2/10.1063/1.2220059
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2220059
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Typical excitation curve of a superconducting cavity made of bulk niobium before and after baking.

Image of FIG. 2.
FIG. 2.

Oxygen concentration as function of depth obtained from BCS surface resistance measurements (Ref. 2) and calculated with Eq. (10) with and .

Image of FIG. 3.
FIG. 3.

Oxygen concentration at the niobium-oxide interface as function of baking temperature. The functions and represent the contribution due to the interstitial oxygen originally present and as a result of the oxide decomposition, respectively.

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/content/aip/journal/apl/89/2/10.1063/1.2220059
2006-07-13
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Improved oxygen diffusion model to explain the effect of low-temperature baking on high field losses in niobium superconducting cavities
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2220059
10.1063/1.2220059
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