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X-ray powder diffraction patterns of pulverized and pellets. The inset shows reference peaks for phase from ICDD Card No. 06-0416.
Electrical resistivity vs temperature for (open circle) and (open square). The inset represents magnified view of curve for Ni-doped ITO sample.
Fittings of logarithm of electrical resistivity (r) vs temperature (T) for sample applying (a) variable range hopping and (b) nearest neighbor hopping conduction models.
Magnetization as a function of temperature for samples Ni-doped (open circle) and Ni-doped ITO (open square) under applied magnetic field. Insets: loops of the same samples at (left) and (right).
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