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Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy
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10.1063/1.2221404
/content/aip/journal/apl/89/2/10.1063/1.2221404
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2221404
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic of model film-adhesion sample in cross section. [(b) and (c)] Contact-resonance-frequency images of the cantilever’s first and second flexural modes and , respectively. [(d) and (e)] Average frequency vs position across the center of the images in (b) and (c), respectively. The dashed lines in (a) indicate the image region used to obtain the averages.

Image of FIG. 2.
FIG. 2.

(a) Model for cantilever dynamics. (b) Image of the normalized contact stiffness calculated from the contact-resonance-frequency images in Fig. 1. (c) Average stiffness vs position across the center of the image in (b).

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/content/aip/journal/apl/89/2/10.1063/1.2221404
2006-07-12
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2221404
10.1063/1.2221404
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