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A cross-sectional SEM observation of the SMAT Fe sample (a) and a dark-field image with the corresponding electron diffraction patterns (inset) of top surface layer for the as-treated sample (b). A cross-sectional SEM observation of the nitrided SMAT Fe sample (c) and a dark-field image with the corresponding electron diffraction patterns (inset) of the compound layer for the as-treated sample (d).
X-ray diffraction patterns of the nanocrystalline Fe (a) and the coarse-grained Fe (b) nitrided at different temperatures for as indicated.
Thickness of compound layer as a function of nitridation duration at different temperatures as indicated for the nanocrystalline (nc) Fe and the coarse-grained (CG) Fe.
Temperature dependence of the thickness for composite nanocrystalline (nc) nitride layer, in comparison with those for the coarse-grained nitrides layer (CG) nitride layer (Refs. 13 and 14).
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