1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Scanning transmission electron microscope study on vertically correlated quantum dots
Rent:
Rent this article for
USD
10.1063/1.2221890
/content/aip/journal/apl/89/2/10.1063/1.2221890
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2221890
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Top: Bright field micrographs showing QD pairs of samples A and B, respectively. Bottom: Histogram of the lateral displacement of the upper QD with respect to the lower one for a spacer layer thickness of (gray) and (black). The histogram is partitioned in wide classes, e.g., the bar represents all QDs with a lateral displacement between and .

Image of FIG. 2.
FIG. 2.

Left: EELS intensity spectra of the Ga edge of samples A and B of the QDs in the different layers and the embedding GaAs. Right: Setup geometry of the cross-sectional EELS measurements.

Image of FIG. 3.
FIG. 3.

Ga concentration line scan profile deduced from EELS of samples A and B, respectively. The line scan measurement points are indicated in the corresponding -contrast micrographs (right part of the figure).

Loading

Article metrics loading...

/content/aip/journal/apl/89/2/10.1063/1.2221890
2006-07-14
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning transmission electron microscope study on vertically correlated InGaAs∕GaAs quantum dots
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/2/10.1063/1.2221890
10.1063/1.2221890
SEARCH_EXPAND_ITEM