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PL spectra of the porous alumina films. The samples were anodized for from the unpolished Al foils [sample (a)] and from the polished Al foil [sample (b)], respectively. The surface mean roughness of the unpolished and polished Al foils were 38 and , respectively, measured by AFM over a scan area of .
(Color online) PL spectra of the porous alumina films with the same pore diameter but different thicknesses (samples 1–7, from the lower to the upper; note Table I). All samples were anodized from polished Al foils. The PL spectrum of sample 4 is also highlighted in Fig. 1 [sample (b)]. The inserted SEM image of porous alumina film indicates a porosity of 8%. The scale bar is .
Sketch of the PL oscillations due to the interference between emitting light 1 and under the approximation of plane-parallel (or Fabry-Pérot) resonator. Note that the size of the round cell tip is much less than the wavelength of emitting light.
Linar dependence between optical length and film thickness. The slope of the fitted line represents the effective refractive index of the sample of porous alumina film.
Parameter dependence of the PL oscillation (the thickness was measured using SEM).
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