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Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams
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10.1063/1.2397561
/content/aip/journal/apl/89/22/10.1063/1.2397561
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/22/10.1063/1.2397561
/content/aip/journal/apl/89/22/10.1063/1.2397561
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/content/aip/journal/apl/89/22/10.1063/1.2397561
2006-11-29
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/22/10.1063/1.2397561
10.1063/1.2397561
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