Full text loading...
(Color online) Charge coupled device camera picture of the AFM SIL tip. Inset: The SIL at the edge of the optic fiber.
(Color online) Transmission mode scan of a NSOM calibration grating of vanadium on quartz (NT-MDT, Moscow, Russia).
(Color online) Diagram of the NSOM tip scanning the SIL base.
(Color online) Maximum intensity value from each scan is plotted vs the NSOM tip-SIL distance. The intensity decays exponentially with a decay constant of .
(Color online) Raman spectrum measured without the SIL (a) and with the SIL (b). Acquisition time was . The strained silicon peak is 54% of the silicon peak in (a) and is 99% of the silicon peak in (b).
Article metrics loading...