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(Color online) (a) SEM image showing randomly oriented PAMPS nanofibers deposited on an electrode. The inset shows a magnified SEM image of a nanofiber with a diameter of about . (b) A schematic diagram of the process used to align a single nanofiber on the AFM calibration grating with -wide periodic trenches, and (c) an AFM image showing well-aligned PAMPS nanofibers.
SEM image showing a cross-sectional shape of a nanofiber cut using a diamond pen without cooling with liquid nitrogen after the nanofiber was aligned on a Si wafer.
(Color online) (a) AFM contact mode image showing a single nanofiber magnified for the measurement of elastic modulus, [(b) and (c)] height profiles of the single nanofiber shown in Fig. 3(a) [(b)—black solid line and (c)—white dotted line], (d) a height profile for determining a width of the single nanofiber shown in Fig. 3(a), (e) a diagram showing the relationship between the reduced diameter and the height of the measured nanofibers, and (f) a diagram showing the aspect ratio (height/width) of the measured nanofibers according to the height of the nanofibers.
(Color online) (a) Force-displacement curves obtained by applying a vertical force via an AFM tip to a single PAMPS nanofiber (dotted line) and the surface of an AFM grating as a reference (solid line), and (b) a plot of the size-dependent elastic modulus vs the diameter (height) of PAMPS nanofibers.
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